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Leakage Current Test -
- SCR's both forward and reverse
- IGBT's & NPN's forward
- Diodes reverse
Gate Test -
- SCR's Gate Voltage and Gate Current to Trigger
- IGBT's Gate Voltage to Trigger
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Applications
Product Line Testing
Laboratory Evaluations
QC Inspection
Field Service
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Model M3K SCR/Diode Tester:
Rated to 3000 V. Both measure reverse and forward leakage currents
(IRRM/IDRM) at voltages up to rated voltage for SCR's. It also measures forward leakage on Diodes. In addition,
this tester measure Gate Voltage and Gate current to Trigger (VGT/IGT) on SCR's and IGBT's as per JEDEC JC22,
RS397, suggested standards for Thyristors. To make observation of the characteristics of the semiconducter easier,
an output jack and cable is provided for connecting an "X-Y" oscilloscope translating to the "E-I"
characteristics of the semiconducter under test.
The M3K meter will indicate voltages to 2999V.
A test voltage is applied as a sine wave rectified 60 Hz. wave form, the magnitude of which is controlled by the
front panel "Powerstat". The meter indicates "PEAK" voltages and currents. The Gate Test applies
a DC voltage to the SCR's Gate. The Anode supply is a half sine wave rectified 60 Hz wave form with a peak value
of about 14 V and a source of about 10 Ohm. Raising the Powerstat slowly will light a LED on the front panel to
indicate triggering. |
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General Specifications:
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Current Leak Testing
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Gate Testing
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| Peak Voltage: |
| | (IRRM/IDRM): | 3000 V. |
| Test Direction: |
| | IGBT: | Forward |
| | SCR: | Forward and Reverse |
| | IGBT: | Forward |
| | NPN: | Forward |
| | Diode: | Reverse |
| | Waveform: | 60 Hz, half sine wave |
| Peak Leakage Current: | 20 mA |
| | Auxiliary Jacks: | E and I for X-Y Scope |
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| Anode (collector) Waveform: | 12.6 V RMS, half wave rectified |
| | Peak Gate Voltage: | 19.99 V |
| | Peak Gate Current: | 1,999 mA |
| | Current Trigger Indicator: | LED |
| | Auxiliary Jacks: | E and I for X-Y Scope |
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